The Microelectronic Reliability Lab (MiReLab) is a research

 

group led by Prof. Hyungtak Kim with interests broadly within the

 

field of semiconductor and display technology.

 

 

 

MiReLab currently investigates the physics and application of Wide Band Gap (WBG) semiconductor devices for power electronics and extreme environment electronics. In particular, we are interested in reliability physics which dominates the failure mechanism of device charateristics.

 

GaN power devices

Extreme Environment

 

If you are thinking of joining MiReLab to do exciting research, please don't hesitate to contact Prof. Kim or any other lab members!

 

 

 

 

Copyright (C) 2011 Hongik Uni. MiRe Lab. All rights reserved.

P508, Electronic and Electrical Engineering, Hongik University, 94, Wausan-ro, Mapo-gu, Seoul, Korea

TEL: +82-2-320-3013   FAX: +82-2-320-1193   Email: rmaehdalf@hanmail.net